Apparatus for controlling activation period of word line of volatile memory device and method thereof

ABSTRACT

An apparatus for controlling an activation period of a word line of a volatile memory device is disclosed. The apparatus adjusts the activation period of the word line using a member for adjusting a pulse width of a pulse signal that activates the word line according to an operation mode of the volatile memory device.

BACKGROUND OF THE INVENTION

1. Field of the invention

The present invention relates to an apparatus for controlling anactivation period of a word line of a volatile memory device and amethod thereof, an more particularly to an apparatus for controlling anactivation period of a word line of a volatile memory device and amethod thereof that can make the activation period of the word linedifferent according to an operation mode of the volatile memory device.

2. Description of the Prior Art

As is well known, a volatile memory device (hereinafter referred to as amemory device) performs a refresh operation for a predetermined time inorder to prevent loss of data stored in memory cells.

The refresh operation is classified into an auto-refresh operation thatis performed by an external command and a self-refresh operation that isperformed in the memory device itself. The present invention speciallyrefers to the self-refresh operation.

Generally, the self-refresh operation is as follows.

If a self-refresh flag signal that indicates the self-refresh operationis enabled, an address signal is generated by an internal countercircuit of the memory device, and a word line corresponding to thegenerated address signal is activated.

If the word line is activated, a charge sharing occurs between thememory cell and a bit line, and the potential level on the bit line ischanged.

A sense amplifier that has sensed the level change on the bit lineamplifies and restores the level change in the memory cell. If therestoring operation is completed, the word line is inactivated and thebit line is precharged by an auto-precharge command.

As described above, during the self-refresh operation, the word line isactivated for a predetermined time. Here, the time period in which theword line is activated is necessary for restoring the data in the memorycell. The activation of the word line for the predetermined time isperformed in the same manner in a normal operation such as a readoperation.

Meanwhile, it is not required that the time period in which the wordline is activated in a self-refresh mode is equal to the time period inwhich the word line is activated in a normal operation mode. This isbecause although the minimum time period, in which the word line shouldbe kept activated due to a data processing speed and so on, has beendetermined by a specification of the memory device in the normaloperation mode, the time period for the word line activation in theself-refresh mode may be lengthened in comparison to that in the normaloperation mode since the safe restoring of the data in the memory cellis more important than the data processing speed in the self-refreshmode.

However, the conventional apparatus for controlling the activationperiod of the word line outputs a pulse signal having a constant pulsewidth irrespective of the operation mode of the memory device.Accordingly, the same time period for the word line activation isprovided irrespective of the operation mode.

Generally, if the characteristic of the memory cell is good, it is nohindrance to set the word line activation period to a constant valueirrespective of the operation mode.

However, if the characteristic of the memory cell is not good, thesituation changes. This is because if the characteristic of the memorycell is not good, a sufficient time period for restoring the data in thememory cell is required.

This will now be explained in more detail with reference to FIGS. 1 aand 1 b.

FIGS. 1 a and 1 b are views explaining the characteristics of the memorycell and the memory cell transistor. In FIG. 1 a, the term “ln(Id)”denotes a drain current, and “Vgs” denotes a gate-source voltage of thetransistor.

As illustrated in FIG. 1 b, in the case of the characteristic A of thememory cell transistor, data can be restored within a specified timeperiod t1, but in the case of the characteristic B of the memory celltransistor, the time period t1 is insufficient to complete the restoringof the data. That is, as shown in FIG. 1 b, in the case of thecharacteristic B of the memory cell transistor, a specified time periodt2 is required to restore the data. Accordingly, in consideration of thecharacteristics of the memory cell transistor, it is necessary tocontrol the activation period of the word line according to theoperation mode of the memory device.

However, the conventional apparatus has the drawbacks in that since theactivation period of the word line is constant irrespective of theoperation mode of the memory device, it is difficult to control the timeperiod required to restore the data according to the operation mode orthe characteristic of the memory cell.

SUMMARY OF THE INVENTION

Accordingly, the present invention has been made to solve theabove-mentioned problems occurring in the prior art, and an object ofthe present invention is to provide an apparatus for controlling anactivation period of a word line of a volatile memory device and amethod thereof that can control the activation period of the word lineaccording to an operation mode of the volatile memory device.

The present invention provides a scheme for stably restoring the dataeven if the characteristic of a memory cell transistor is not good bylengthening the activation period of the word line during a self-refreshoperation.

In a first embodiment of the present invention, there is provided anapparatus for controlling an activation period of a word line of avolatile memory device, which adjusts the activation period of the wordline using means for adjusting a pulse width of a pulse signal thatactivates the word line according to an operation mode of the volatilememory device.

In the first embodiment of the present invention, the activation periodof the word line in the case in which the operation mode is a refreshmode is longer than the activation period of the word line in the casein which the operation mode is a normal mode.

In the first embodiment of the present invention, the means foradjusting the pulse width of the pulse signal is used to activate theword line by selecting one of first and second pulse signals that havepulse widths different from each other. Here, the second pulse signal isselected in the case in which the operation mode is the refresh mode andthe first pulse signal is selected in the case in which the operationmode is the normal mode, and the activation period of the second pulsesignal is longer than the activation period of the first pulse signal.

In a second embodiment of the present invention, there is provided amethod of controlling an activation period of a word line of a volatilememory device, which adjusts the activation period of the word line byadjusting a pulse width of a pulse signal that activates the word lineaccording to an operation mode of the volatile memory device.

In the second embodiment of the present invention, the activation periodof the word line in the case in which the operation mode is a refreshmode is longer than the activation period of the word line in the casein which the operation mode is a normal mode.

In a third embodiment of the present invention, there is provided anapparatus for controlling an activation period of a word line of avolatile memory device, which comprises a first skewed delay unit forreceiving a first pulse signal for activating the word line andoutputting a second pulse signal having a pulse width different from apulse width of the first pulse signal, a second skewed delay unit forreceiving the second pulse signal and outputting a third pulse signalhaving a pulse width different from that of the second pulse signal, anda switching unit for selecting one of the second pulse signal and thethird pulse signal.

In the third embodiment of the present invention, the second or thirdpulse signal that passes through the switching unit is a signal foractivating the word line. Here, the pulse width of the third pulsesignal is wider than the pulse width of the second pulse signal, and thepulse width of the second pulse signal is wider than the pulse width ofthe first pulse signal. The word line is activated during a pulse widthperiod of the third pulse signal or a pulse width period of the secondpulse signal. Additionally, if an operation mode of the volatile memorydevice is a normal mode, the word line is activated by the second pulsesignal, and if the operation mode of the volatile memory device is arefresh mode, the word line is activated by the third pulse signal.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other objects, features and advantages of the presentinvention will be more apparent from the following detailed descriptiontaken in conjunction with the accompanying drawings, in which:

FIGS. 1 a and 1 b are views explaining the characteristics of the memorycell and the memory cell transistor;

FIGS. 2 a and 2 b are views illustrating examples of the apparatus forcontrolling an activation period of a word line according to the presentinvention;

FIG. 3 a is a view illustrating the potential level change of a signaltrasmin for activating the word line and bit lines BL and /BL in thecase in which the memory device is in a normal operation mode; and

FIG. 3 b is a view illustrating the potential level change of a signaltrasmin for activating the word line and bit lines BL and /BL in thecase in which the memory device is in a refresh operation mode.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Hereinafter, preferred embodiments of the present invention will bedescribed with reference to the accompanying drawings. In the followingdescription and drawings, the same reference numerals are used todesignate the same or similar components, and so repetition of thedescription on the same or similar components will be omitted.

FIGS. 2 a and 2 b are views illustrating examples of the apparatus forcontrolling an activation period of a word line according to the presentinvention. In FIG. 2 a, a signal actb is a pulse signal that isgenerated by a row active signal caused by a normal operation or arefresh command and that is kept at a low level for a predeterminedtime. A signal trasmin is a signal for activating the word line of thememory device for a minimum period required for restoring the data so asto satisfy the refresh regulation. The waveform of the signal trasmin isillustrated in FIGS. 3 a and 3 b.

The control apparatus of FIG. 2 a includes a skewed delay unit 201 forreceiving the signal actb, a skewed delay unit 202 for receiving anoutput signal of the skewed delay unit 201, a skewed delay unit 203 forreceiving an output signal of the skewed delay unit 202, a switchingunit 204 for selecting and outputting one of the output signal of theskewed delay unit 202 and an output signal of the skewed delay unit 203,and a driving inverter 205 for receiving an output signal of theswitching unit 204. For reference, the switching unit 204 is controlledby a control signal selfref. The control signal is a signal generated inresponse to the refresh command, and it is at a low level in case of thenormal operation while it is at a high level in case of the refreshoperation.

The skewed delay unit illustrated in FIG. 2 a is a circuit formodulating the pulse width of the input signal, and its detailedconstruction is illustrated in FIG. 2 b.

The skewed delay unit illustrated in FIG. 2 b includes a delay unit 20for receiving and delaying an input signal in for a predetermined time,a NAND gate 21 for receiving the input signal in and an output signal ofthe delay unit 20, and an inverter 22 for receiving an output signal ofthe NAND agate 21. An output signal out of the inverter 22 is the outputsignal of the skewed delay unit.

The skewed delay unit illustrated in FIG. 2 b is a circuit for receivinga low-level pulse signal and outputting a pulse width modulatedlow-level pulse signal. The circuit of FIG. 2 b is a circuit forincreasing the pulse width of the input signal in, and those skilled inthe art could diversely implement the pulse width modulation circuithaving the same function as the circuit of FIG. 2 b.

Hereinafter, the operation of the apparatus according to the presentinvention will be explained with reference to FIGS. 2 a and 2 b.

In the normal operation, the control signal selfref is at a low level,and the signal actb that is a low-level pulse signal is transferredthrough a path 1. That is, the signal actb is transferred to theinverter 205 via the skewed delay units 201 and 202. The pulse width ofthe output signal trasmin of the inverter 205 is longer than the pulsewidth of the signal actb. This is because the pulse width of the inputsignal is modulated as the input signal passes through the skewed delayunits 201 and 202 that are the pulse width modulation circuits forlengthening the pulse width of the input signal.

Then, in the refresh operation, the control signal selfref is at a highlevel, and the signal actb is transferred through a path 2. That is, thesignal actb is transferred to the inverter 205 through the skewed delayunits 201, 202 and 203. The pulse width of the output signal trasmin ofthe inverter is longer than the pulse width of the signals actb. This isbecause the pulse width of the input signal is modulated as the inputsignal passes through the skewed delay units 201, 202 and 203 that arethe pulse width modulation circuits for lengthening the pulse width ofthe input signal. As shown in the drawings, if the path 2 is selected,the skewed delay unit 203 is additionally connected to the circuit.Accordingly, the pulse width of the output signal trasmin in the case inwhich the path 2 is selected is longer than the pulse width of theoutput signal trasmiin in the case in which the path 1 is selected.

As described above, since the pulse width of the signal trasmin in thecase of the refresh operation is longer than the pulse width of thesignal trasmin in the case of the normal operation, it can be recognizedthat the activation period of the word line can be lengthened in thecase of the refresh operation.

FIG. 3 a is a view illustrating the potential level change of the signaltrasmin for activating the word line and bit lines BL and /BL in thecase in which the memory device is in the normal operation mode, andFIG. 3 b is a view illustrating the potential level change of the signaltrasmin for activating the word line and bit lines BL and /BL in thecase in which the memory device is in the refresh operation mode.

In FIGS. 3 a and 3 b, since the level change of the bit lines BL and /BLis caused by the operation of the sense amplifier as is well known inthe art, any additional explanation thereof will be omitted. Meanwhile,the high-level period of the signal trasmin indicates the period inwhich the word line is activated.

If the characteristic of the memory cell transistor is good, thepotential level of the bit line BL would rise up to a drive voltagelevel VCORE before the signal transmit is S shifted to a low level.However, if the characteristic of the memory cell transistor is notgood, the restoring operation may be performed in a state that thepotential level does not rise up to the drive voltage level VCORE. Inthe normal operation such as the read operation, the minimum period inwhich the word line is activated is required due to the processing speedand so on, and thus the problem explained with reference to FIG. 3 a mayoccur. However, in the refresh operation, the activation period of theword line could be lengthened without causing any problem. This will beexplained with reference to FIG. 3 b.

As illustrated in FIG. 3 b, the pulse width of the signal trasmin forcontrolling the activation period of the word line is wider than that asillustrated in FIG. 3 a. Accordingly, even if the characteristic of thememory cell transistor is somewhat lowered, a stable data restoringoperation can be achieved.

The present invention provides a scheme for making the activation periodof the word line different according to the operation mode of thevolatile memory device, i.e., whether the memory device is in the normalmode or in the refresh mode.

As described above, according to the circuit for differently controllingthe activation period of the word line according to the operation modeof the memory device according to the present invention, a stablerestoring operation can be achieved even if the characteristic of thememory cell is not good.

Although preferred embodiments of the present invention have beendescribed for illustrative purposes, those skilled in the art willappreciate that various modifications, additions and substitutions arepossible, without departing from the scope and spirit of the inventionas disclosed in the accompanying claims.

1. An apparatus for controlling an activation period of a word line of avolatile memory device, comprising: a delay unit receiving a first pulsesignal for activating the word line and outputting a second pulsesignal; a switching unit selecting one of the first pulse signal and thesecond pulse signal, wherein if an operation mode of the volatile memorydevice is a normal mode, the word line is activated by the first pulsesignal; and if the operation mode of the volatile memory device is arefresh mode, the word line is activated by the second pulse signal. 2.The apparatus as claimed in claim 1, wherein the first or second pulsesignal that passes through the switching unit is a signal for activatingthe word line.
 3. The apparatus as claimed in claim 2, wherein the pulsewidth of the second pulse signal is wider than the pulse width of thefirst pulse signal.
 4. The apparatus as claimed in claim 2, wherein theword line is activated during a pulse width period of the first pulsesignal or a pulse width period of the second pulse signal.
 5. Anapparatus for controlling an activation period of a word line of avolatile memory device, comprising: a pulse width modulation unitmodulating an input pulse signal for activating the word line andoutputting a modulated pulse signal having a pulse width different froma pulse width of the input pulse signal; a switching unit selecting oneof the input pulse signal and the modulated pulse signal, wherein if anoperation mode of the volatile memory device is a normal mode, the wordline is activated by the input pulse signal; and if the operation modeof the volatile memory device is a refresh mode, the word line isactivated by the modulated pulse signal.
 6. The apparatus as claimed inclaim 5, wherein the input or modulated pulse signal that passes throughthe switching unit is a signal for activating the word line.
 7. Theapparatus as claimed in claim 6, wherein the pulse width of themodulated pulse signal is wider than the pulse width of the input pulsesignal.
 8. The apparatus as claimed in claim 6, wherein the word line isactivated during a pulse width period of the input pulse signal or apulse width period of the modulated pulse signal.
 9. A method ofcontrolling an activation period of a word line of a volatile memorydevice, comprising the step of: receiving a first pulse signal foractivating the word line and outputting a second pulse signal having -apulse width different from a pulse width of the first pulse signal; andselecting one of the first pulse signal and the second pulse signal,wherein if an operation mode of the volatile memory device is a normalmode, the word line is activated by the first pulse signal; and if theoperation mode of the volatile memory device is a refresh mode, the wordline is activated by the second pulse signal.
 10. The method as claimedin claim 9, wherein the first or second pulse signal that passes throughthe switching unit is a signal for activating the word line.
 11. Themethod as claimed in claim 10, wherein the pulse width of the secondpulse signal is wider than the pulse width of the first pulse signal.12. The method as claimed in claim 11, wherein the word line isactivated during a pulse width period of the first pulse signal or apulse width period of the second pulse signal.
 13. A method ofcontrolling an activation period of a word line of a volatile memorydevice, comprising step of: modulating an input pulse signal foractivating the word line and outputting a modulated pulse signal havinga pulse width different from a pulse width of the input pulse signal;and selecting one of the input pulse signal and the modulated pulsesignal, wherein if an operation mode of the volatile memory device is anormal mode, the word line is activated by the input pulse signal; andif the operation mode of the volatile memory device is a refresh mode,the word line is activated by the modulated pulse signal.
 14. The methodas claimed in claim 13, wherein the input or modulated pulse signal is asignal for activating the word line.
 15. The method as claimed in claim14, wherein the pulse width of the modulated pulse signal is wider thanthe pulse width of the input pulse signal.
 16. The method as claimed inclaim 14, wherein the word line is activated during a pulse width periodof the input pulse signal or a pulse width period of the modulated pulsesignal.